Tianshu Jiang

Advanced Electron Microscopy, TU Darmstadt
Darmstadt, Hessen, Germany

Presentation(s):

• In Situ TEM Investigation of Conductive Bridge RAM devices

  Monday, July 29, 2024
  1:30 PM - 1:45 PM US EST

• Atomically Stable Cryogenic In Situ Biasing (S)TEM holder with Precise Temperature Control Over a Wide Range of Temperatures

  Tuesday, July 30, 2024
  2:00 PM - 2:15 PM US EST