Niklas Dellby

Bruker AXS, United States

Presentation(s):

• Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces

  Tuesday, July 30, 2024
  10:30 AM - 10:45 AM US EST

• Open-Source Phase Reconstructions of Focused-Probe 4D-STEM Data with Near-Ideal Direct-Electron Detection

  Wednesday, July 31, 2024
  9:30 AM - 9:45 AM US EST