Masoud Baghernejad

Helmholtz-Institute Münster,IEK-12, Forschungszentrum Jülich GmbH, Germany

Presentation(s):

• The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales.

  Wednesday, July 31, 2024
  9:15 AM - 9:30 AM US EST