Jean-Nicolas Audinot

Senior Researcher
Luxembourg Institute of Science and Technology (LIST)
Belvaux, Luxembourg

Expert for applications in SIMS for 20 years, with particular focus on NanoSIMS instrument and IMS, I trained engineers and PhD students for their different professional activities (Analysis platform, European PhD School, PhD Thesis). Since 2015, I has been in charge of the NanoFab HIM-SIMS instrument and DualBeam FIB-SIMS in the AINA group. My mission consists in valorising the SIMS add-on FIB system by application development on all kinds of samples (photovoltaic, battery, soil, ..)

Presentation(s):

• Magnetic Sector SIMS Systems for FIB Platforms: New Developments, Applications, and Prospects

  Wednesday, July 31, 2024
  8:30 AM - 9:00 AM US EST

• The IONMASTER magSIMS: an innovative multi-ion species FIB platform for correlative high-resolution ion microscopy and SIMS analyses

  Wednesday, July 31, 2024
  9:00 AM - 9:15 AM US EST

• Advanced Focused Ion Beam Methods and Multimodal Microscopy Techniques for the Analysis of Epoxy-Embedded and Native Bio-Samples

  Wednesday, July 31, 2024
  2:00 PM - 2:15 PM US EST