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Final Program


Analytical Sciences Symposia

A07.P1 - Triumphs, Trials, and Trepidations in Quantifying Low-Z Elements with Microanalytical Methods

(238) Development of Electron-Beam Induced Soft X-ray and Vacuum Ultraviolet Emission Spectrometer

Wednesday, July 31, 2024
3:00 PM - 5:00 PM US EST
Location: Exhibit Hall

    Presenting Author(s)

  • SK

    Shogo Koshiya

    JEOL Ltd. SA Business Unit
    Akishima, Tokyo, Japan

    • Co-Author(s)

  • TM

    Takanori Murano

    JEOL Ltd, SA business Unit
    Akishima, Tokyo, Japan

  • Peter McSwiggen

    EPMA Applications
    JEOL USA Inc.
    Peabody, Massachusetts, United States

  • Vern Robertson

    EPMA / SA Product Manager
    JEOL USA Inc.
    Peabody, Massachusetts, United States


All papers can be viewed in the published Meeting Proceedings on the MaM journal website.