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Final Program


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Analytical Sciences Symposia

A07.3 - Triumphs, Trials, and Trepidations in Quantifying Low-Z Elements with Microanalytical Methods

Detecting Trace Boron Doped in Tungsten Plates Using ToF-SIMS, Raman, and SEM

Wednesday, July 31, 2024
11:30 AM - 11:45 AM US EST
Location: 14

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • Xiao-Ying Yu

    Distinguished Scientist
    Oak Ridge National Laboratory
    Oak Ridge National Laboratory
    Oak Ridge, Tennessee, United States

    • Co-Author(s)

  • TG

    Tim Graening

    Oak Ridge National Laboratory, United States

  • GY

    Guang Yang

    Oak Ridge National Laboratory, United States

  • TT

    Tanguy Terlier

    Rice University, United States

  • GP

    Gabriel Parker

    Oak Ridge National Laboratory, United States

  • YK

    Yutai Katoh

    Oak Ridge National Laboratory, United States