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Final Program


Featured Symposium

Analytical Sciences Symposia

A11.1 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Capabilities for Study of Advanced 2D Materials and Thin Foils

Wednesday, July 31, 2024
11:15 AM - 11:45 AM US EST
Location: 19

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • IM

    Ilona Müllerová (she/her/hers)

    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Jihomoravsky kraj, Czech Republic

    • Co-Author(s)

  • IK

    Ivo Konvalina (he/him/his)

    Senior Researcher
    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Czech Republic

  • AP

    Aleš Paták (he/him/his)

    Senior Researcher
    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Jihomoravsky kraj, Czech Republic

  • LP

    Lukáš Průcha (he/him/his)

    Institute of Scientific Instruments of the Czech Academy of Sciences, Jihomoravsky kraj, Czech Republic

  • MZ

    Martin Zouhar (he/him/his)

    Senior Researcher
    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Jihomoravsky kraj, Czech Republic

  • JP

    Jakub Piňos (he/him/his)

    Ph.D. student
    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Jihomoravsky kraj, Czech Republic

  • EM

    Eliška Materna Mikmeková (she/her/hers)

    Team leader, Senior Researcher
    Institute of Scientific Instruments of the Czech Academy of Sciences
    Brno, Jihomoravsky kraj, Czech Republic