Featured Symposium

Direct Quantification of Grain Boundary Space Charge Layers using Multislice Electron Ptychography

Presenting Author(s)

• CG

  Colin Gilgenbach

  Massachusetts Institute of Technology
  Cambridge, Massachusetts, United States

Co-Author(s)

• TD

  Thomas Defferriere, Ph.D

  Massachusetts Institute of Technology, United States
• HT

  Harry L. Tuller, Ph.D

  Massachusetts Institute of Technology, United States
• JL

  James M. LeBeau, Ph.D

  Professor
  Massachusetts Institute of Technology
  Cambridge, Massachusetts, United States