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Final Program


Featured Symposium

Cross-Disciplinary Symposia

C04.3 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

Automating X-ray Fluorescence Mapping with Differentiable Modeling

Thursday, August 1, 2024
4:00 PM - 4:15 PM US EST
Location: 1

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • XY

    Xiangyu Yin

    Argonne National Laboratory, Illinois, United States

    • Co-Author(s)

  • ZD

    Zichao Wendy Di

    Assistant Computational Scientist
    Argonne National Laboratory, United States

  • OA

    Olga Antipova

    Argonne National Laboratory, United States

  • Si Chen

    Physicist
    Argonne National Laboratory
    Argonne National Laboratory
    Lemont, Illinois, United States

  • YJ

    Yi Jiang

    Beamline Data Scientist
    Argonne National Laboratory
    Argonne National Laboratory, United States

  • AG

    Arthur Glowacki

    Argonne National Laboratory, United States