Skip to main content
M&M 2024 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Featured Symposium

Cross-Disciplinary Symposia

C04.3 - Machine Learning-driven Automated Microscopy for Materials Discovery and Semiconductor Manufacturing

The use of Artificial Intelligence and Machine learning in soft X-ray technology for Advanced Semiconductor Process Development and Control

Thursday, August 1, 2024
3:30 PM - 4:00 PM US EST
Location: 1

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.