Featured Symposium

Improvement of Boron Dopant Quantification Accuracy in Atom Probe Tomography via High Electric Field Analysis

Presenting Author(s)

• BG

  Bavley Guerguis

  Department of Materials Science & Engineering, McMaster University, Canada

Co-Author(s)

• RC

  Ramya Cuduvally, Ph.D

  Department of Materials Science & Engineering, McMaster University, Canada
• RM

  Richard J. H. J.H. Morris, Ph.D

  Researcher
  IMEC
  Leuven, Vlaams-Brabant, Belgium
• GA

  Gabriel Arcuri, Ph.D

  Canadian Centre for Electron Microscopy, McMaster University, Canada
• BL

  Brian Langelier, Ph.D

  Department of Materials Science & Engineering, McMaster University, Canada
• 

  Nabil Bassim, Ph.D

  Department of Materials Science & Engineering, McMaster University
  (2) Scientific Director of the Canadian Center of Electron Microscopy (CCEM), Hamilton, L8S4L8, ON, Canada
  Hamilton, Ontario, Canada