.jpg "Masato Koike photo")
Visiting Researcher
National Institutes for Quantum Science and Technology
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan
Dr. Masato Koike joined Shimadzu Corporation after receiving his PhD from Osaka City University in 1979. Then he joined a project to build Japan's first 6m-class high-resolution extreme ultraviolet vertical dispersion spectrometer at the synchrotron radiation facility, KEK-PF. It achieved the world's highest resolution at that time for both photographic spectroscopy and photoelectric measurement. This spectroscope provided a lot of new data on the energy level of atomic molecules and the cross-sectional area of light absorption, which greatly contributed to the progress of atomic and molecular spectroscopy.
Since 1989, he had been a researcher at the Lawrence Berkeley National Laboratory (LBNL) X-ray Optical Center (CXRO). Dr. Koike involved to a beamline design employing the Monk-Gillieson (MG) type monochromator, which combines a spherical mirror and a varied-line-spacing diffraction grating for advanced light source (ALS). Dr. Koike established the design methods based on the theory analytically derived from the exact expression of ray as well as based on combination of analytical expression of ray tracing and its numerical calculation. The constructed MG-type spectrometers exhibited an excellent performance such as clearly decomposing the hyperfine structure of the K-shell absorption edge of nitrogen.
Since 1997, Dr. Koike has been working at the KPSI of Quantum Science and Technology Research and Development Organization (QST). He constructed and operated a soft X-ray optical element evaluation beamline at the SR Center of Ritsumeikan University, which had been contributed to the improvement of the performance of soft X-ray optical elements. Furthermore, Dr. Koike has designed the world's first soft X-ray flat field varied-line-spacing spherical diffraction gratings introducing aspherical wavefronts into holographic recording method. The gratings have been installed to the spectrometers attached to commercial electron microscopes, and greatly contributed to material science and technology in the academic and industrial purposes.
