Skip to main content
M&M 2024 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Featured Symposium

Physical Sciences Symposia

P09.2 - Advances in In Situ TEM Characterization of Dynamic Processes in Materials

PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices

Tuesday, July 30, 2024
11:45 AM - 12:00 PM US EST
Location: 6

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

    Presenting Author(s)

  • William Hubbard, PhD (he/him/his)

    CEO
    NanoElectronic Imaging Inc.
    Riverside, California, United States

    • Co-Author(s)

  • BR

    B. C. Regan

    Professor
    University of California, Los Angeles
    (2) California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, United States, United States