CEO
NanoElectronic Imaging Inc.
Riverside, California, United States
William A. Hubbard earned a B.S. in physics and mathematics from Boston University in 2008, after which he worked as a research assistant in the Harvard University Physics Department until 2010. He received his Ph.D. in condensed matter experimental physics in 2017 from the University of California, Los Angeles, where he was a postdoctoral scholar until 2019. He is currently the CEO of NanoElectronic Imaging Inc. (NEI), which was founded in 2017. His research focuses on nanoscale device physics and the development of TEM-based techniques for detecting electronic and thermal signals in operating devices.
TEM Imaging of Bias-Induced Electronic Changes in a GaN HEMT
Monday, July 29, 2024
2:15 PM - 2:30 PM US EST
Understanding Ferroelectric Polarization in Hafnium Zirconium Oxide
Tuesday, July 30, 2024
9:30 AM - 10:00 AM US EST
PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices
Tuesday, July 30, 2024
11:45 AM - 12:00 PM US EST
TEM Specimen Preparation for STEM-EBIC Analysis of Advanced Semiconductor Devices
Wednesday, July 31, 2024
2:00 PM - 2:15 PM US EST
Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor
Thursday, August 1, 2024
2:00 PM - 2:15 PM US EST
Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping
Thursday, August 1, 2024
2:15 PM - 2:30 PM US EST
