Featured Symposium

TEM Specimen Preparation for STEM-EBIC Analysis of Advanced Semiconductor Devices

Presenting Author(s)

• 

  Cecile Bonifacio

  Senior Applications Scientist
  E.A. Fischione Instruments, Inc., United States

Co-Author(s)

• 

  William Hubbard, PhD (he/him/his)

  CEO
  NanoElectronic Imaging Inc.
  Riverside, California, United States
• RL

  Richard Li, PhD (he/him/his)

  Sales/Service Manager for Taiwan
  EA Fischione Instruments Inc., United States
• MR

  Mary Ray

  Marketing and Communications Manager
  E.A. Fischione Instruments, Inc., United States
• PF

  Paul Fischione

  CEO
  E.A. Fischione Instruments, Inc., United States