Paul Fischione

CEO
E.A. Fischione Instruments, Inc., United States

Presentation(s):

• Determining the best Ar ion milling sample preparation conditions for SEM applications

  Wednesday, July 31, 2024
  10:45 AM - 11:00 AM US EST

• Latest Developments in Post-FIB Concentrated Ar Ion Beam Milling of TEM Specimens with Large Electron-transparent Areas

  Wednesday, July 31, 2024
  11:00 AM - 11:15 AM US EST

• TEM Specimen Preparation for STEM-EBIC Analysis of Advanced Semiconductor Devices

  Wednesday, July 31, 2024
  2:00 PM - 2:15 PM US EST

• Chasing Down Leads: Imaging Conductivity Networks in a FinFET Processor

  Thursday, August 1, 2024
  2:00 PM - 2:15 PM US EST