The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales.

Wednesday, July 31, 2024

9:15 AM - 9:30 AM US EST

Location: 3

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.

Presenting Author(s)

VR

Valentine Riedo-Grimaudo

TOFWERK, Bern, Switzerland
JW

James Whitby

TOFWERK
Thun, Bern, Switzerland
RP

Renato Pero

Application Scientist
Alemnis
Thun, Switzerland
NR

Nicholas Randall

Alemnis, Switzerland
MB

Masoud Baghernejad

Helmholtz-Institute Münster,IEK-12, Forschungszentrum Jülich GmbH, Germany