Skip to main content
M&M 2024 Meeting (Microscopy & Microanalysis) Main banner
Final Program


Featured Symposium

Analytical Sciences Symposia

A11.4 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

Unified Approach to Standards-Based Absolute Quantification of EDX and EEL Spectra of Nanoscale Materials in STEM and STEM-in-SEM

Thursday, August 1, 2024
2:30 PM - 2:45 PM US EST
Location: 19

All papers can be viewed in the published Meeting Proceedings on the MaM journal website.