Milena Hugenschmidt

Fraunhofer Institute for Physical Measurement Techniques IPM, Freiburg, Germany

Presentation(s):

• A11.1 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

  Wednesday, July 31, 2024
  10:30 AM - 12:00 PM US EST

• A11.3 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

  Thursday, August 1, 2024
  8:30 AM - 9:45 AM US EST

• A11.5 - Perspectives from Complementary SEM Techniques: STEM-in-SEM Analytics and High-throughput Multi-beam Imaging

  Thursday, August 1, 2024
  3:30 PM - 4:45 PM US EST